Mapping the wavefunction of transition metal acceptor states in the GaAs surface

We utilize a single atom substitution technique with spectroscopic imaging in a scanning tunneling microscope (STM) to visualize the anisotropic spatial structure of magnetic and non-magnetic transition metal acceptor states in the GaAs (110) surface. The character of the defect states play a critical role in the properties of the semiconductor, the localization of the states influencing such things as the onset of the metal-insulator transition, and in dilute magnetic semiconductors the mechanism and strength of magnetic interactions that lead to the emergence of ferromagnetism. We study these states in the GaAs surface finding remarkable similarities between the shape of the acceptor state wavefunction for Mn, Fe, Co and Zn dopants, which is determined by the GaAs host and is generally reproduced by tight binding calculations of Mn in bulk GaAs [Tang, J.M. & Flatte, M.E., Phys. Rev. Lett. 92, 047201 (2004)]. The similarities originate from the antibonding nature of the acceptor states that arise from the hybridization of the impurity d-levels with the host. A second deeper in-gap state is also observed for Fe and Co that can be explained by the symmetry breaking of the surface.Comment: 19 pages, 6 figure

Characterizing the Structure of Topological Insulator Thin Films

We describe the characterization of structural defects that occur during molecular beam epitaxy of topological insulator thin films on commonly used substrates. Twinned domains are ubiquitous but can be reduced by growth on smooth InP (111)A substrates, depending on details of the oxide desorption. Even with a low density of twins, the lattice mismatch between (Bi,Sb)2Te3 and InP can cause tilts in the film with respect to the substrate. We also briefly discuss transport in simultaneously top and back electrically gated devices using SrTiO3 and the use of capping layers to protect topological insulator films from oxidation and exposure

Low temperature saturation of phase coherence length in topological insulators

Implementing topological insulators as elementary units in quantum technologies requires a comprehensive understanding of the dephasing mechanisms governing the surface carriers in these materials, which impose a practical limit to the applicability of these materials in such technologies requiring phase coherent transport. To investigate this, we have performed magneto-resistance (MR) and conductance fluctuations\ (CF) measurements in both exfoliated and molecular beam epitaxy grown samples. The phase breaking length ($l_{\phi}$) obtained from MR shows a saturation below sample dependent characteristic temperatures, consistent with that obtained from CF measurements. We have systematically eliminated several factors that may lead to such behavior of $l_{\phi}$ in the context of TIs, such as finite size effect, thermalization, spin-orbit coupling length, spin-flip scattering, and surface-bulk coupling. Our work indicates the need to identify an alternative source of dephasing that dominates at low $T$ in topological insulators, causing saturation in the phase breaking length and time

Persistent Optical Gating of a Topological Insulator

Topological insulators (TIs) have attracted much attention due to their spin-polarized surface and edge states, whose origin in symmetry gives them intriguing quantum-mechanical properties. Robust control over the chemical potential of TI materials is important if these states are to become useful in new technologies, or as a venue for exotic physics. Unfortunately, chemical potential tuning is challenging in TIs in part because the fabrication of electrostatic top-gates tends to degrade material properties and the addition of chemical dopants or adsorbates can cause unwanted disorder. Here, we present an all-optical technique which allows persistent, bidirectional gating of a (Bi,Sb)2Te3 channel by optically manipulating the distribution of electric charge below its interface with an insulating SrTiO3 substrate. In this fashion we optically pattern p-n junctions in a TI material, which we subsequently image using scanning photocurrent microscopy. The ability to dynamically write and re-write mesoscopic electronic structures in a TI may aid in the investigation of the unique properties of the topological insulating phase. The optical gating effect may be adaptable to other material systems, providing a more general mechanism for reconfigurable electronics.Comment: 5 pages, 5 figure